Barai, Samit and Selvarajan, A and Srinivas, T and Madhan, T and Fazludeen, R (2003) A Novel technique to measure propagation loss of optical waveguides. In: 11th IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications:EDMO 2003, 17-18 November, Orlando, FL, USA, pp. 250-254.
A method to measure the propagation loss of optical waveguides is discussed. The measurement system involves two 3 dB couplers, a CCD camera and a signal processing unit. The propagation loss measured from this technique is found to be independent of coupling conditions. The propagation properties of waveguides prepared by proton exchange (PE) in Lithium Niobate $(LiNbO_3)$ and Silver ion exchange in BK7 glass substrates are examined. Finally the variation of mode propagation loss for various annealing parameters of PE waveguides is discussed.
|Item Type:||Conference Paper|
|Additional Information:||Copyright 2004 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Department/Centre:||Division of Electrical Sciences > Electrical Communication Engineering|
|Date Deposited:||25 Aug 2008|
|Last Modified:||19 Sep 2010 04:36|
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