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Study of layered structured ferroelectric materials grown by laser ablation

Bhattacharyya, S and Krupanidhi, SB (2001) Study of layered structured ferroelectric materials grown by laser ablation. In: Ferroelectrics, 260 . pp. 161-167.

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Abstract

Layered structured ferroelectric thin films of different compounds were deposited by an excimer laser ablation process. $SrBi_2Nb_2O_9$ was here chosen as the initial compound. The remnant and spontaneous polarization in a pure $SrBi_2Nb_2O_9$ thin film was found to be 6 $\mu C/cm^2$ and 15 $\mu C/cm^2$ respectively. The dielectric constant was 220 at 100 kHz. In the films, the usual 'B' site cation, '$Nb^ {+2}$' replaced '$Ta^{+2}$' partially. Different parameters were chosen during deposition, which in turn controlled the $Sr^{+2}/Ta^{+5}$ ratio. It was seen that the extent of crystallinity and the microstructure depends upon the amount of '$Sr^{+2}$', present in the compound. The dielectric and the conduction properties were studied as a function of the cation $(Ta^{+2}/Nb^{+2})$ ratio in the 'B' site, to study the coupling phenomenon.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Taylor and Francis
Keywords: PLD;SBN;Ferroeletrics
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Date Deposited: 09 Aug 2007
Last Modified: 27 Aug 2008 12:44
URI: http://eprints.iisc.ernet.in/id/eprint/10463

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