Bharadwaja, SSN and Krupanidhi, SB (2001) Study of AC electrical properties in multigrain antiferroelectric lead zirconate thin films. In: Thin Solid Films, 391 (1). pp. 126-132.
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Antiferroelectric lead zirconate (PZ) thin films were deposited by excimer laser ablation technique on Pt-coated Si substrates. Antiferroelectric thin film compositions are potential candidates for high charge storage and microelectromechanical systems. The antiferroelectric nature in PZ thin films was confirmed by means of double hysteresis behaviour in polarisation vs. applied electric field and double butterfly response in capacitance vs. applied voltage measurements. The maximum spontaneous polarisation observed was $37 \mu C/cm^2$ with zero remnant polarisation at an applied electric field of 225 kV/cm. PZ thin films showed a polycrystalline multigrain structure and detail comprehensive study of dielectric relaxation and ac electrical properties were carried out.
|Item Type:||Journal Article|
|Additional Information:||Copyright of this article belongs to Elsevier.|
|Keywords:||Antiferroelectric PZ thin films;Laser ablation;Dielectric properties;Electrical properties;Measurements|
|Department/Centre:||Division of Chemical Sciences > Materials Research Centre|
|Date Deposited:||30 Mar 2007|
|Last Modified:||19 Sep 2010 04:36|
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