Narahari, Y and Khan, LM (1995) Modeling Re-entrant Manufacturing Systems with Inspections. In: IEEE International Conference on Robotics and Automation, 21-27 May 1995, Nagoya, Japan, Vol.2, 367-378.
Inspection stations are now an integral part of any manufacturing system and help track product quality and process performance. In this paper we consider re-entrant manufacturing systems (such as semiconductor fabrication facilities) with inspections at various stages of processing. At the end of each inspection, three possibilities are assumed, namely accept, reject, or rework at some previous stage. We propose re-entrant lines with probabilistic routing as models for such systems and present an eficient analytical technique based on mean value analysis to predict mean cycle times and throughput rates. We can use the method to compare different ways of locating inspection stations, from a cycle time and throughput view-point.
|Item Type:||Conference Paper|
|Additional Information:||Copyright of this article belongs to IEEE.|
|Department/Centre:||Division of Electrical Sciences > Computer Science & Automation (Formerly, School of Automation)|
|Date Deposited:||14 Aug 2007|
|Last Modified:||19 Sep 2010 04:37|
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