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Protocol test sequence generation using MUIOS based on TSP problem

Kumar, Prem G and Venkataram, P (1995) Protocol test sequence generation using MUIOS based on TSP problem. In: in : National Conference on Computer Networks, Architecture and Applications, Jan. 1995, Madras, India, pp. 163-174.

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Abstract

In this paper, a method for optimal test sequence generation using Multiple Unique Input/Output Sequences (MUIOS) is presented. The test sequence generation problem using MUIOS is viewed as an asymmetric travelling sales person problem and is solved using simulated annealing methodology. This technique is applied to various test cases and the results are compared with the results obtained by using rural Chinese postman algorithm

Item Type: Conference Paper
Additional Information: Copyright of this article belongs to Chapman & Hall.
Keywords: conformance testing;protocols;simulated annealing;travelling salesman problems
Department/Centre: Division of Electrical Sciences > Electrical Communication Engineering
Date Deposited: 20 Sep 2007
Last Modified: 11 Jan 2012 05:54
URI: http://eprints.iisc.ernet.in/id/eprint/10964

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