Roy, A and Chainani, A and Sarma, DD and Sood, AK (1992) Photoemission study of porous silicon. In: Applied Physics Letters, 61 (14). pp. 1655-1657.
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We report x-ray photoelectron spectra from a porous silicon film (PSF) with a photoluminescence peak at 1.8 eV, as a function of argon ion etching time to probe the composition in the surface and the subsurface regions. The results clearly indicate that the surface layer is essentially a fluorine admixed $SiO_2$ phase, while the Si:O:F composition of the subsurface region 2:1:0.2. With the possibility of the existence of hydrogen in this composition it appears that beyond the highly oxidized surface, PSF is a fluorine substituted siloxene derivative, which can be responsible for the visible photoluminescence.
|Item Type:||Journal Article|
|Additional Information:||Copyright of this article belongs to American Institute of Physics.|
|Keywords:||Photoemission study;porous silicon;porous silicon film;PSF|
|Department/Centre:||Division of Chemical Sciences > Solid State & Structural Chemistry Unit
Division of Physical & Mathematical Sciences > Physics
|Date Deposited:||06 Dec 2007|
|Last Modified:||19 Sep 2010 04:41|
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