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Effect of pressure on the emf of solid-state cells

Jacob, KT and Iwase, M (1983) Effect of pressure on the emf of solid-state cells. In: High Temperature Science, 16 (2). pp. 123-129.

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Abstract

The effect of pressure on the emf of solid-state galvanic cells: $Pt|Ni + NiO|ZrO_2(CaO)|Cu + Cu_2O|Pt (cell I) and Pt|SFeO + Fe_3O_4|ZrO_2(CaO)||Fe_3O_4 + Fe_2O_3|Pt$ (cell II) were measured in the pressure range 1.01 \times 105 to 8.08 \times 108 Pa. Within experimental error, the emf was found to vary linearly with pressure: EI (1000 K)/mV = 275.5 + 2.62 | 10-8 [(P/Pa) - 101,325] EII (896 K)/mV = 442.5 - 2.45 10-8 [(P/Pa) - 101,325]. These results are consistent with available data on entropy and volume changes associated with the cell reactions.

Item Type: Journal Article
Additional Information: Copyright belongs to Humana Press
Department/Centre: Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)
Date Deposited: 09 Apr 2008
Last Modified: 27 Aug 2008 13:18
URI: http://eprints.iisc.ernet.in/id/eprint/13566

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