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Accurate measurement of thermal expansion of solids between 77 K and 350 K by 3-terminal capacitance method

Subrahmanyam, HN and Subramanyam, SV (1986) Accurate measurement of thermal expansion of solids between 77 K and 350 K by 3-terminal capacitance method. In: Pramana, 27 (5). pp. 647-660.

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Abstract

The construction of a 3-terminal capacitance cell and a bath-type cryostat to measure thermal expansion of solids in the temperature range 77 K to 350 K is described. Calculation of the thermal expansion coefficients by using spline approximation is discussed along with the various errors involved in the measurement. The capacitance cell is calibrated by using aluminium and germanium as standard reference materials. The cell has an accuracy of 4% in the measurement of thermal expansion coefficient and a resolution of 1 A change in length of sample of length 1 cm.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Indian Academy of Sciences.
Keywords: Thermal expansion;low temperature;three-terminal capacitance method.
Department/Centre: Division of Physical & Mathematical Sciences > Physics
Date Deposited: 07 Apr 2008
Last Modified: 19 Sep 2010 04:44
URI: http://eprints.iisc.ernet.in/id/eprint/13700

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