ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Critical dielectric constant measurement in binary liquid systems

Jyothi, S and Gunasekaran, MK and Chandrasekara, Shetty and Gopal, ESR (1983) Critical dielectric constant measurement in binary liquid systems. In: Nuclear Physics and Solid State Physics Symposium, pp. 610-611.

Full text not available from this repository. (Request a copy)

Abstract

The capacitance of a MeOH-n-heptane mixture near the critical component was measured near the critical temperature at 4 frequencies. Analysis of the data by using a nonlinear multiparameter fit routine produced an exponent of 0.65-0.7 in the temperature dependence of capacitance.

Item Type: Conference Paper
Additional Information: Copyright of this article belongs to American Chemical Society.
Department/Centre: Division of Physical & Mathematical Sciences > Physics
Date Deposited: 09 Apr 2008
Last Modified: 27 Aug 2008 13:19
URI: http://eprints.iisc.ernet.in/id/eprint/13702

Actions (login required)

View Item View Item