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Structural and Electrical Properties of Resistive Thermal Evaporated $Cd_{1-x}Mn_xS$ Nano-Crystalline Films

Reddy, Sreekantha D and Reddy, BK and Reddy, Koteeswara N and Gunasekhar, KR and Reddy, Sreedhara P (2007) Structural and Electrical Properties of Resistive Thermal Evaporated $Cd_{1-x}Mn_xS$ Nano-Crystalline Films. In: Synthesis and Reactivity in Inorganic, Metal-Organic, and Nano-Metal Chemistry, 37 (5). pp. 373-376.

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Abstract

Thin films of $Cd_{1-x}Mn_xS$ $(0\leq x \leq 0.5)$ were prepared on window glass substrates by resistive vacuum thermal evaporation. All the films were deposited at 300 K and the films annealed at 373 K, 473 K and 573 K for 1 hour in a vacuum of $10^{-6} m$. bar. The as-deposited and the annealed films were characterized by EDAX, XRD, AFM, electrical conductivity and Hall Effect studies.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Taylor & Francis Group.
Keywords: diluted magnetic semiconductors;Cd1-x MnxS thin films;resistive thermal evaporation technique;electrical studies
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU)
Date Deposited: 03 Jun 2008
Last Modified: 27 Aug 2008 13:25
URI: http://eprints.iisc.ernet.in/id/eprint/14172

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