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Scanning Electron Microscopy, X-Ray Microanalysis and Analytical Electron Microscopy

Lyman, Charles E and Newbury, Dale E and Goldstein, Joseph I and Williams, David B and Romig, Alton D and Armstrong, John T and Echlin, Patrick and Fiori, Charles E and Joy, David C and Lifshin, Eric and Peters, Klaus-Ruediger (1993) Scanning Electron Microscopy, X-Ray Microanalysis and Analytical Electron Microscopy. In: Journal of the Electrochemical Society of India, 42 (4). pp. 262-263.

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Item Type: Journal Article
Additional Information: Copyright of this article belongs to Electrochemical Society of India.
Department/Centre: Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)
Date Deposited: 11 Aug 2008
Last Modified: 27 Aug 2008 13:29
URI: http://eprints.iisc.ernet.in/id/eprint/14518

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