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Growth and ferroelectric properties of $Bi_2VO_{5.5}$ thin films with metallic $LaNiO_3$ electrodes

Prasad, KVR and Varma, KBR and Raju, AR and Satyalakshmi, KM and Mallya, RM and Hegde, MS (1993) Growth and ferroelectric properties of $Bi_2VO_{5.5}$ thin films with metallic $LaNiO_3$ electrodes. In: Applied Physics Letters, 63 (14). pp. 1898-1900.

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Abstract

Novel ferroelectric bismuth vanadate, {Bi_2VO_{5.5}} (BVO), thin films have been grown between lattice matched metallic {LaNiO_3} (LNO) layers deposited on {SrTiO_3} (STO) by the pulsed laser deposition technique. LNO/BVO/LNO/STO and Au/BVO/LNO/STO trilayer structures exhibited c-oriented (001) growth of BVO. LNO has been found to be a good metallic electrode with sheet resistance {\sim \Omega 20} in addition to aiding c-axis oriented BVO growth. The dielectric constant, {\epsilon_r} of LNO/BVO/LNO/STO, at 300 K was about 12. However, when an Au electrode was used on top of BVO/LNO/STO film, it showed a significant improvement in the dielectric constant {(\epsilon_r = 123)}. The ferroelectric properties of BVO thin films have been confirmed by hysteresis behavior with a remnant polarization, {P_r - 4.6×10^{-8} C/cm^2} and coercive field, {E_c = 23 kV/cm} at 300 K.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to the American Institute of Physics.
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Division of Chemical Sciences > Solid State & Structural Chemistry Unit
Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)
Date Deposited: 30 Jun 2008
Last Modified: 19 Sep 2010 04:46
URI: http://eprints.iisc.ernet.in/id/eprint/14713

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