ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Electrical switching and thermal studies on $Ge_{22}Te_{78-x}I_x$ chalcohalide glasses: The effect of iodine on network-topology

Pattanayak, Pulok and Asokan, S (2007) Electrical switching and thermal studies on $Ge_{22}Te_{78-x}I_x$ chalcohalide glasses: The effect of iodine on network-topology. In: Solid State Communications, 142 (12). pp. 698-701.

[img] PDF
Electrical_switching.pdf
Restricted to Registered users only

Download (345Kb) | Request a copy

Abstract

Investigations on the electrical switching behavior and thermal studies using Alternating Differential Scanning Calorimetry have been undertaken on bulk, melt-quenched $Ge_{22}Te_{78-x}I_x$ (3 \leq x \leq 10) chalcohalide glasses. All the glasses studied have been found to exhibit memory-type electrical switching. The threshold voltages of $Ge_{22}Te_{78-x}I_x$ glasses have been found to increase with the addition of iodine and the composition dependence of threshold voltages of $Ge_{22}Te_{78-x}I_x$ glasses exhibits a cusp at 5 at.% of iodine. Also, the variation with composition of the glass transition temperature $(T_g)$ of $Ge_{22}Te_{78-x}I_x$ glasses, exhibits a broad hump around this composition. Based on the present results, the composition x = 5 has been identified as the inverse rigidity percolation threshold at which $Ge_{22}Te_{78-x}I_x$ glassy system exhibits a change from a stressed rigid amorphous solid to a flexible polymeric glass. Further, a sharp minimum is seen in the composition dependence of non-reversing enthalpy $(\Delta H_{nr})$ of $Ge_{22}Te_{78-x}I_x$ glasses at x = 5, which is suggestive of a thermally reversing window at this composition.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Elsevier.
Keywords: A. Chalcohalide glasses;C. Temperature modulated differential scanning calorimetry;D. Electrical switching
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU)
Date Deposited: 05 Aug 2008
Last Modified: 19 Sep 2010 04:48
URI: http://eprints.iisc.ernet.in/id/eprint/15399

Actions (login required)

View Item View Item