Iftiquar, SM (2008) Line width measurement of semiconductor lasers using quantum interference in electromagnetically induced transparency: a quantum heterodyning method. In: Optical Engineering, 47 (6). 064201-064201.
Full text not available from this repository. (Request a copy)Abstract
A technique is described in which electromagnetically induced transparency (EIT) spectra are used to measure laser line width. Two independent sets of EIT measurements are carried out in the presence of $^{85}Rb$ and $^{87}Rb$ atomic isotopes. Conventional self-heterodyning detection is used to obtain standard values of laser line width. A comparison shows that the estimated laser line widths in these measurements are very close to each other.
| Item Type: | Journal Article |
|---|---|
| Additional Information: | Copyright of this article belongs to Society of Photo-Optical Instrumentation Engineers. |
| Keywords: | Self-heterodyning;laser spectroscopy;quantum interference; electromagnetically induced transparency. |
| Department/Centre: | Division of Physical & Mathematical Sciences > Physics |
| Date Deposited: | 26 Aug 2008 |
| Last Modified: | 27 Aug 2008 13:42 |
| URI: | http://eprints.iisc.ernet.in/id/eprint/15560 |
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