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Line width measurement of semiconductor lasers using quantum interference in electromagnetically induced transparency: a quantum heterodyning method

Iftiquar, SM (2008) Line width measurement of semiconductor lasers using quantum interference in electromagnetically induced transparency: a quantum heterodyning method. In: Optical Engineering, 47 (6). 064201-064201.

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Abstract

A technique is described in which electromagnetically induced transparency (EIT) spectra are used to measure laser line width. Two independent sets of EIT measurements are carried out in the presence of $^{85}Rb$ and $^{87}Rb$ atomic isotopes. Conventional self-heterodyning detection is used to obtain standard values of laser line width. A comparison shows that the estimated laser line widths in these measurements are very close to each other.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Society of Photo-Optical Instrumentation Engineers.
Keywords: Self-heterodyning;laser spectroscopy;quantum interference; electromagnetically induced transparency.
Department/Centre: Division of Physical & Mathematical Sciences > Physics
Date Deposited: 26 Aug 2008
Last Modified: 27 Aug 2008 13:42
URI: http://eprints.iisc.ernet.in/id/eprint/15560

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