Sreenivasulu, M and Patra, SK and Rao, Mohan G (2001) Powered automatic measuring system for Langmuir probe plasma analysis. In: Review of Scientific Instruments, 72 (11). pp. 4312-4314.
Powered.pdf - Published Version
Restricted to Registered users only
Download (48Kb) | Request a copy
Langmuir probe analysis of a sputtering glow discharge leads to errors in measurements due to contamination of the probe surface by the sputter deposition from the target. An automatic Langmuir probe system using a personal computer has been designed. The design details and performance evaluation of this system are discussed in this article.
|Item Type:||Journal Article|
|Additional Information:||Copyright of this article belongs to American Institute of Physics.|
|Department/Centre:||Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU)|
|Date Deposited:||26 Sep 2008 09:00|
|Last Modified:||19 Sep 2010 04:50|
Actions (login required)