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Signatures of an extended rigidity percolation in the photo-degradation behavior and the composition dependence of photo-response of Ge-Te-In glasses

Manikandan, N and Asokan, S (2008) Signatures of an extended rigidity percolation in the photo-degradation behavior and the composition dependence of photo-response of Ge-Te-In glasses. In: Journal of Non-Crystalline Solids, 354 (31). pp. 3732-3734.

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Abstract

Time dependent photocurrent measurements have been undertaken on bulk $Ge_{15}Te_{85-x}In_x (1 \leq x \leq 11)$ series of glasses. It is found that samples with x < 3 do not exhibit any photo-degradation whereas a decrease in photo-conductivity under illumination is observed in samples with $x\geq3$. Further, the photosensitivity of $Ge_{15}Te_{85-x}In_x$ glasses is found to reveal specific signatures at compositions x = 3 and 7. The observed composition dependent photo-degradation behavior and photo-response of these glasses have been understood on the basis of an extended rigidity percolation and its influence on network related properties.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Elsevier.
Keywords: Chalcogenides;Photoinduced effects;Photo-conductivity.
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU)
Date Deposited: 07 Oct 2008 07:01
Last Modified: 19 Sep 2010 04:51
URI: http://eprints.iisc.ernet.in/id/eprint/16156

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