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Sidewall inclined slot in a rectangular waveguide: Theory and experiment

Prakash, VVS and Christopher, S and Balakrishnan, N (1998) Sidewall inclined slot in a rectangular waveguide: Theory and experiment. In: IEE Procedings Microwaves Antennas and Propagation, 145 (03). pp. 233-238.

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Abstract

A novel analysis to compute the admittance characteristics of the slots cut in the narrow wall of a rectangular waveguide, which includes the corner diffraction effects and the finite waveguide wall thickness, is presented. A coupled magnetic field integral equation is formulated at the slot aperture which is solved by the Galerkin approach of the method of moments using entire domain sinusoidal basis functions. The externally scattered fields are computed using the finite difference method (FDM) coupled with the measured equation of invariance (MEI). The guide wall thickness forms a closed cavity and the fields inside it are evaluated using the standard FDM. The fields scattered inside the waveguide are formulated in the spectral domain for faster convergence compared to the traditional spatial domain expansions. The computed results have been compared with the experimental results and also with the measured data published in previous literature. Good agreement between the theoretical and experimental results is obtained to demonstrate the validity of the present analysis.

Item Type: Journal Article
Additional Information: Copyright 1998 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords: rectangular waveguides;admittance;edge slots;finite difference method;method of moments.
Department/Centre: Division of Information Sciences > Supercomputer Education & Research Centre
Date Deposited: 17 Dec 2009 08:00
Last Modified: 19 Sep 2010 05:27
URI: http://eprints.iisc.ernet.in/id/eprint/19233

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