Gururaj, BI and Satish, L (2002) Detection and Localization of Inter-turn Fault in the HV Winding of a Power Transformer using Wavelets- Comment. In: IEEE Transactions on Dielectrics and Electrical Insulation, 9 (3). pp. 479-480.
We discuss the paper by M.R. Rao and B.P. Singh (ibid. vol. 8, pp. 652-657, 2001) describing a wavelet approach for identification and localization of "minor" or "small" faults within HV transformer windings during lightning impulse tests on them. Although the authors' claim appear to be impressive, there are serious questions regarding the circuit models and computational procedures used, as well as, in the interpretation of the results obtained from the wavelet method. Therefore, the following is intended to obtain clarification from the authors and to help the reader with the usage of wavelets in addressing such problems.
|Item Type:||Journal Article|
|Additional Information:||©2002 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Department/Centre:||Division of Electrical Sciences > High Voltage Engineering (merged with EE)|
|Date Deposited:||09 Dec 2004|
|Last Modified:||19 Sep 2010 04:16|
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