Chandra, MM and Kumaran, V (1984) A simple circuit to aid direct measurement of capture cross sections of deep level impurities. In: Journal Of Physics E-Scientific Instruments, 17 (11). pp. 949-951.
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An inexpensive and simple circuit to aid the direct measurement of majority carrier capture cross sections of impurity levels in the band gap of a semiconductor by the variable width filling pulse technique is presented. With proper synchronisation, during the period of application of the pulse, the device is disconnected from the capacitance meter to avoid distortion of the pulse and is reconnected again to the meter to record the emission transient. Modes of operation include manual triggering for long emission transients, repetitive triggering for isothermal and DLTS measurements and the DLTS mode which is to be used with signal analysers that already provide a synchronising pulse for disconnection.
|Item Type:||Journal Article|
|Additional Information:||Copyright for this article belongs to IOP Publishing Ltd|
|Department/Centre:||Division of Physical & Mathematical Sciences > Physics|
|Date Deposited:||04 Feb 2010 07:34|
|Last Modified:||19 Sep 2010 05:32|
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