ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Testing threshold functions using implied minterm structure

Sarje, AK and Biswas, NN (1983) Testing threshold functions using implied minterm structure. In: International Journal of Systems Science., 14 (5). pp. 497-512.

Full text not available from this repository. (Request a copy)
Official URL: http://www.informaworld.com/smpp/content~db=all~co...

Abstract

A geometrical structure called the implied minterm structure (IMS) has been developed from the properties of minterms of a threshold function. The IMS is useful for the manual testing of linear separability of switching functions of up to six variables. This testing is done just by inspection of the plot of the function on the IMS.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Taylor and Francis Group.
Department/Centre: Division of Electrical Sciences > Electrical Communication Engineering > Electrical Communication Engineering - Technical Reports
Date Deposited: 06 Feb 2010 07:07
Last Modified: 06 Feb 2010 07:07
URI: http://eprints.iisc.ernet.in/id/eprint/20803

Actions (login required)

View Item View Item