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Investigation of Deep Defects Due to -Particle Irradiation in n-Silicon

Indusekhar, H and Kumaran, V and Sengupta, D (1986) Investigation of Deep Defects Due to -Particle Irradiation in n-Silicon. In: Physica Status Solidi A, 93 (2). pp. 645-653.

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Official URL: http://www3.interscience.wiley.com/journal/1124455...

Abstract

Electrical properties of deep defects induced in n-silicon by -particles of about 10 MeV energy at a dose of 1014 and 1015 cm-2 are studied by DLTS. The levels at Ec -0.18 eV, Ec -0.26 eV, and Ec -0.48 eV are identified as A center, V2 (=/-) and V2 (-/0) on the basis of activation energy, electron capture cross section, and annealing behavior. Two other irradiation related levels at Ec -0.28 eV and Ec -0.51 eV could not be related to any known center.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to John Wiley and Sons.
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Division of Physical & Mathematical Sciences > Physics
Date Deposited: 26 Aug 2009 18:32
Last Modified: 19 Sep 2010 05:41
URI: http://eprints.iisc.ernet.in/id/eprint/22207

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