Chandni, U and Manjula, MV and Ghosh, Arindam and Vijaya, HS and Mohan, Srinivasa L (2009) Sensing Shape Recovery Using Conductivity Noise in Thin Films of NiTi Shape Memory Alloys. In: Symposium V on Materials, Devices, and Characterization for Smart Systems held at the 2008 MRS Fall Meeting, DEC 01-04, 2008, Boston, MA, pp. 125-130.Full text not available from this repository.
Low frequency fluctuations in the electrical resistivity, or noise, have been used as a sensitive tool to probe into the temperature driven martensite transition in dc magnetron sputtered thin films of nickel titanium shape-memory alloys. Even in the equilibrium or static case, the noise magnitude was more than nine orders of magnitude larger than conventional metallic thin films and had a characteristic dependence on temperature. We observe that the noise while the temperature is being ramped is far larger as compared to the equilibrium noise indicating the sensitivity of electrical resistivity to the nucleation and propagation of domains during the shape recovery. Further, the higher order statistics suggests the existence of long range correlations during the transition. This new characterization is based on the kinetics of disorder in the system and separate from existing techniques and can be integrated to many device applications of shape memory alloys for in-situ shape recovery sensing.
|Item Type:||Conference Paper|
|Additional Information:||Copyright for this article belongs to Materials Research Society.|
|Department/Centre:||Division of Physical & Mathematical Sciences > Physics|
|Date Deposited:||22 Dec 2009 06:52|
|Last Modified:||22 Dec 2009 06:52|
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