Naito, H and Shah, Arvind V (1978) Time-Domain Measurement of Voltage Induction by Transient EM Fields. In: Transactions on Instrumentation and Measurement, 27 (1). pp. 38-42.
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An efficient measurement technique for studying the effect of transient electromagnetic fields under controlled conditions has been described. Broad-band TEM fields with a rise-time of a few nanoseconds were generated using a stripline method. Theoretical results are obtained and experimental measurements which confirm these results are described. The work will form the basis for a study of the susceptibility of digital integrated circuits and their interconnections to transient electromagnetic fields.
|Item Type:||Journal Article|
|Additional Information:||Copyright 1978 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Department/Centre:||Division of Electrical Sciences > Electrical Communication Engineering|
|Date Deposited:||18 Jan 2010 07:11|
|Last Modified:||19 Sep 2010 05:50|
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