Mahapatra, D Roy and Sinha, N and Melnik, RVN and Yeow, JT W (2008) Field Emission Properties of Carbon Nanotube Arrays with Defects and Impurities. In: Nanotechnology Conference and Trade Show (Nanotech 2008), JUN 01-05, 2008, Boston, MA, pp. 729-732.
NSTI2008_Defects.pdf - Published Version
Restricted to Registered users only
Download (342Kb) | Request a copy
It has been found experimentally that the results related to the collective field emission performance of carbon nanotube (CNT) arrays show variability. The emission performance depends on the electronic structure of CNTs (especially their tips). Due to limitations in the synthesis process, production of highly pure and defect free CNTs is very difficult. The presence of defects and impurities affects the electronic structure of CNTs. Therefore, it is essential to analyze the effect of defects on the electronic structure, and hence, the field emission current. In this paper, we develop a modeling approach for evaluating the effect of defects and impurities on the overall field emission performance of a CNT array. We employ a concept of effective stiffness degradation for segments of CNTs, which is due to structural defects. Then, we incorporate the vacancy defects and charge impurity effects in our Green's function based approach. Simulation results indicate decrease in average current due to the presence of such defects and impurities.
|Item Type:||Conference Proceedings|
|Additional Information:||copyright of this conference proceedings paper belongs to CRC PRESS-TAYLOR & FRANCIS GROUP.|
|Keywords:||carbon nanotube; field emission; electron-phonon; defect; impurity; transport|
|Department/Centre:||Division of Mechanical Sciences > Aerospace Engineering (Formerly, Aeronautical Engineering)|
|Date Deposited:||09 Jan 2010 11:53|
|Last Modified:||16 May 2011 09:58|
Actions (login required)