Bhattacharyya, S and Laha, Apurba and Krupanidhi, SB (2002) Impact of Sr content on dielectric and electrical properties of pulsed laser ablated SrBi2Ta2O9 thin films. In: Journal of Applied Physics, 92 (2). pp. 1056-1061.
The ferroelectric properties of SrBi2Ta2O9 thin films grown by laser ablation were investigated as a function of the Sr+2 content in the films. Different target compositions were used to obtain films with different Sr+2/Ta+5 ratios. The initial composition was according to the stoichiometric composition (1/2), and the Sr+2/Ta+5 ratio was varied to 0.7/2.0. It was seen that the remanent polarization showed a consistent increase, as the film became more deficient of "Sr+2" up to a certain extent. Similarly, a decrease in the dielectric constant and the leakage current with the decrease of Sr+2 in the film was observed. The dielectric transition temperature showed an increase with the reduction of Sr+2 content and was seen to approach the bulk value.
|Item Type:||Journal Article|
|Additional Information:||Copyright for this article belongs to American Institute of Physics (AIP).|
|Department/Centre:||Division of Chemical Sciences > Materials Research Centre|
|Date Deposited:||31 Dec 2004|
|Last Modified:||19 Sep 2010 04:17|
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