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Time Domain Characteristics of Electrical Measures for a Piezoelectric Thin Film to Identify Defects in the Substrate

Ali, Rizwaan and Mahapatra, DR and Gopalakrishnan, S (2010) Time Domain Characteristics of Electrical Measures for a Piezoelectric Thin Film to Identify Defects in the Substrate. In: Structural Health Monitoring, 9 (2). pp. 173-192.

Full text not available from this repository.
Official URL: http://shm.sagepub.com/cgi/content/abstract/9/2/17...

Abstract

A reduced 3D continuum model of dynamic piezoelectricity in a thin-film surface-bonded to the substrate/host is presented in this article. While employing large area flexible thin piezoelectric films for novel applications in device/diagnostics, the feasibility of the proposed model in sensing the surface and/or sub-surface defects is demonstrated through simulations - which involve metallic beams with cracks and composite beam with delaminations of various sizes. We have introduced a set of electrical measures to capture the severity of the damage in the existing structures. Characteristics of these electrical measures in terms of the potential difference and its spatial gradients are illustrated in the time domain. Sensitivity studies of the proposed measures in terms of the defected areas and their region of occurence relative to the sensing film are reported. The simulations' results for electrical measures for damaged hosts/substrates are compared with those due to undamaged hosts/substrates, which show monotonicity with high degree of sensitivity to variations in the damage parameters.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Sage Publications.
Keywords: piezoelectrics; thin films; electro-mechaical model; diagnostics; cracks/delamination; lamb wave
Department/Centre: Division of Mechanical Sciences > Aerospace Engineering (Formerly, Aeronautical Engineering)
Date Deposited: 05 Mar 2010 09:26
Last Modified: 05 Mar 2010 09:26
URI: http://eprints.iisc.ernet.in/id/eprint/25891

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