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Crack Tip Fields in a Single Edge Notched Aluminum Single Crystal Specimen

Patil, Swapnil D and Narasimhan, R and Biswas, P and Mishra, RK (2008) Crack Tip Fields in a Single Edge Notched Aluminum Single Crystal Specimen. In: 5th International Conference on Materials Processing Defects (MDP-5), JUL 18-20, 2007, Ithaca, NY.

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Abstract

We report a combined experimental and computational study of a low constraint aluminum single crystal fracture geometry and investigate the near-tip stress and strain fields. To this end, a single edge notched tensile (SENT) specimen is considered. A notch, with a radius of 50 µm, is taken to lie in the (010) plane and its front is aligned along the [101] direction. Experiments are conducted by subjecting the specimen to tensile loading using a special fixture inside a scanning electron microscope chamber. Both SEM micrographs and electron back-scattered diffraction (EBSD) maps are obtained from the near-tip region. The experiments are complemented by performing 3D and 2D plane strain finite element simulations within a continuum crystal plasticity framework assuming an isotropic hardening response characterized by the Pierce–Asaro–Needleman model. The simulations show a distinct slip band forming at about 55 deg with respect to the notch line corresponding to slip on (11-bar 1)[011] system, which corroborates well with experimental data. Furthermore, two kink bands occur at about 45 deg and 90 deg with respect to the notch line within which large rotations in the crystal orientation take place. These predictions are in good agreement with the EBSD observations. Finally, the near-tip angular variations of the 3D stress and plastic strain fields in the low constraint SENT fracture geometry are examined in detail.

Item Type: Conference Paper
Additional Information: Copyright of this article belongs to The American Society of Mechanical Engineers.
Department/Centre: Division of Mechanical Sciences > Mechanical Engineering
Date Deposited: 10 Mar 2010 09:27
Last Modified: 19 Sep 2010 05:56
URI: http://eprints.iisc.ernet.in/id/eprint/26085

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