Gangadharan, R and Murthy, CRL and Bhat, MR and Sen, A and Das, N and Seal, A (2007) Embedded PZT wafer sensors for structural health monitoring. In: 33rd Annual Review of Progress in Quantitative Nondestructive Evaluation, JUL 30-AUG 04, 2006, Portland.Full text not available from this repository. (Request a copy)
Recent advances in structural integrity evaluation have led to the development. of PZT wafer sensors (PWAS) which can be embedded or surface mounted for both acoustic emission (AE) and ultrasonic (UT) modes, which forms an integrated approach for Structural Health Monitoring (SHM) of aerospace structures. For the fabrication of PWAS wafers, soft PZT formulation (SP-5H Grade containing dopants like BA, SM, CA, ZN, Y and HF) were used. The piezoelectric charge constant (d(33)) was measured by a d(33) meter. As a first step towards the final objective of developing Health monitoring methods with embedded PWAS, experiments were conducted on aluminum and composite plates of finite dimensions using PWAS sensors. The AE source was simulated by breaking 0.5mm pencil lead on the surface of a thin plate. Experiments were also conducted with surface mounted PZT films and conventional AE sensors in order to establish the sensitivity of PWAS. A comparison of results of theoretical and experimental work shows good agreement.
|Item Type:||Conference Paper|
|Additional Information:||Copyright of this article belongs to American Institute of Physics Conference Proceedings.|
|Department/Centre:||Division of Mechanical Sciences > Aerospace Engineering (Formerly, Aeronautical Engineering)|
|Date Deposited:||10 Jun 2010 09:57|
|Last Modified:||10 Jun 2010 09:57|
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