Verma, Deepti and Sharmila, BH and Rukmani, K and Asokan, S (2008) High pressure studies on the electrical resistivity of As-Te-bond Si glasses and the effect of network topological thresholds. In: International Journal of High Pressure Research, 28 (1). pp. 55-62.
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The variation of resistivity in an amorphous As30Te70-xSix system of glasses with high pressure has been studied for pressures up to 8 GPa. It is found that the electrical resistivity and the conduction activation energy decrease continuously with increase in pressure, and samples become metallic in the pressure range 1.0-2.0 GPa. Temperature variation studies carried out at a pressure of 0.92 GPa show that the activation energies lie in the range 0.16-0.18eV. Studies on the composition/average co-ordination number (r) dependence of normalized electrical resistivity at different pressures indicate that rigidity percolation is extended, the onset of the intermediate phase is around (r) = 2.44, and completion at (r) = 2.56, respectively, while the chemical threshold is at (r) = 2.67. These results compare favorably with those obtained from electrical switching and differential scanning calorimetric studies.
|Item Type:||Journal Article|
|Additional Information:||Copyright of this article belongs to Taylor and Francis Group.|
|Keywords:||chalcogenides;high pressure;electrical resistivity;topological thresholds.|
|Department/Centre:||Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU)|
|Date Deposited:||23 Mar 2010 07:28|
|Last Modified:||19 Sep 2010 05:58|
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