Mondal, Partha Pratim (2010) Multiple excitation nano-spot generation and confocal detection for far-field microscopy. In: Nanoscale, 2 (3). pp. 381-384.
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An imaging technique is developed for the controlled generation of multiple excitation nano-spots for far-field microscopy. The system point spread function (PSF) is obtained by interfering two counter-propagating extended depth-of-focus PSF (DoF-PSF), resulting in highly localized multiple excitation spots along the optical axis. The technique permits (1) simultaneous excitation of multiple planes in the specimen; (2) control of the number of spots by confocal detection; and (3) overcoming the point-by-point based excitation. Fluorescence detection from the excitation spots can be efficiently achieved by Z-scanning the detector/pinhole assembly. The technique complements most of the bioimaging techniques and may find potential application in high resolution fluorescence microscopy and nanoscale imaging.
|Item Type:||Journal Article|
|Additional Information:||Copyright of this article belongs to The Royal Society of Chemistry.|
|Department/Centre:||Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU)|
|Date Deposited:||30 Mar 2010 12:05|
|Last Modified:||19 Sep 2010 05:58|
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