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Multiple excitation nano-spot generation and confocal detection for far-field microscopy

Mondal, Partha Pratim (2010) Multiple excitation nano-spot generation and confocal detection for far-field microscopy. In: Nanoscale, 2 (3). pp. 381-384.

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Abstract

An imaging technique is developed for the controlled generation of multiple excitation nano-spots for far-field microscopy. The system point spread function (PSF) is obtained by interfering two counter-propagating extended depth-of-focus PSF (DoF-PSF), resulting in highly localized multiple excitation spots along the optical axis. The technique permits (1) simultaneous excitation of multiple planes in the specimen; (2) control of the number of spots by confocal detection; and (3) overcoming the point-by-point based excitation. Fluorescence detection from the excitation spots can be efficiently achieved by Z-scanning the detector/pinhole assembly. The technique complements most of the bioimaging techniques and may find potential application in high resolution fluorescence microscopy and nanoscale imaging.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to The Royal Society of Chemistry.
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU)
Date Deposited: 30 Mar 2010 12:05
Last Modified: 19 Sep 2010 05:58
URI: http://eprints.iisc.ernet.in/id/eprint/26634

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