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Investigation of true remnant polarization response in heterostructured artificial biferroics

Chaudhuri, Ayan Roy and Krupanidhi, SB (2010) Investigation of true remnant polarization response in heterostructured artificial biferroics. In: Solid State Communications, 150 (13-14). pp. 660-662.

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Official URL: http://dx.doi.org/10.1016/j.ssc.2009.12.023

Abstract

Epitaxial bilayered thin films composed of ferromagnetic La0.6Sr0.4MnO3 and ferroelectric 0.7Pb (Mg1/3Nb2/3)O3-0.3(PbTiO3) were fabricated on LaAlO3 (100) substrates by pulsed laser ablation. Ferroelectric, ferromagnetic and magneto-dielectric characterizations performed earlier indicated the possible existence of strain-mediated magneto-electric coupling in these biferroic heterostructures. In order to investigate their true remnant polarization characteristics, usable in devices, room-temperature polarization versus electric field, positive-up negative-down (PUND) pulse polarization studies and remnant hysteresis measurements were carried out. The PUND and remnant hysteresis measurements revealed the significant contribution of the non-remnant component in the observed polarization hysteresis response of these heterostructures. (C) 2010 Published by Elsevier Ltd

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Elsevier Science.
Keywords: Thin films;Pulsed laser ablation;Ferroelectrics;Biferroics
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Date Deposited: 09 Jun 2010 05:07
Last Modified: 19 Sep 2010 06:00
URI: http://eprints.iisc.ernet.in/id/eprint/27242

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