ePrints@IIScePrints@IISc Home | About | Browse | Latest Additions | Advanced Search | Contact | Help

Wavelet transform based error concealment approach for image denoising

Gupta, Pradeep K and Kanhirodan, Rajan (2006) Wavelet transform based error concealment approach for image denoising. In: 1st IEEE Conference on Industrial Electronics and Applications (ICIEA 2006),, May 24-26, 2006, Singapore, pp. 338-343.

[img] PDF
04025760.pdf - Published Version
Restricted to Registered users only

Download (1172Kb) | Request a copy
Official URL: http://ieeexplore.ieee.org/search/srchabstract.jsp...

Abstract

Denoising of images in compressed wavelet domain has potential application in transmission technology such as mobile communication. In this paper, we present a new image denoising scheme based on restoration of bit-planes of wavelet coefficients in compressed domain. It exploits the fundamental property of wavelet transform - its ability to analyze the image at different resolution levels and the edge information associated with each band. The proposed scheme relies on the fact that noise commonly manifests itself as a fine-grained structure in image and wavelet transform allows the restoration strategy to adapt itself according to directional features of edges. The proposed approach shows promising results when compared with conventional unrestored scheme, in context of error reduction and has capability to adapt to situations where noise level in the image varies. The applicability of the proposed approach has implications in restoration of images due to noisy channels. This scheme, in addition, to being very flexible, tries to retain all the features, including edges of the image. The proposed scheme is computationally efficient.

Item Type: Conference Paper
Additional Information: Copyright 2006 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU)
Date Deposited: 31 Aug 2010 04:56
Last Modified: 19 Sep 2010 06:12
URI: http://eprints.iisc.ernet.in/id/eprint/30462

Actions (login required)

View Item View Item