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Testing the adhesion of thin films using real-time holographic interferometry: a simple method

Ramprasad, BS and Radha, TS (1978) Testing the adhesion of thin films using real-time holographic interferometry: a simple method. In: Applied Optics, 17 (17). 2670-2670 .

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Official URL: http://www.opticsinfobase.org/abstract.cfm?URI=ao-...
Item Type: Editorials/Short Communications
Additional Information: Copyright of this article belongs to Optical Society of America.
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU)
Date Deposited: 21 Sep 2010 07:03
Last Modified: 21 Sep 2010 07:03
URI: http://eprints.iisc.ernet.in/id/eprint/32297

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