Ramprasad, BS and Radha, TS (1978) Testing the adhesion of thin films using real-time holographic interferometry: a simple method. In: Applied Optics, 17 (17). 2670-2670 .
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| Item Type: | Editorials/Short Communications |
|---|---|
| Additional Information: | Copyright of this article belongs to Optical Society of America. |
| Department/Centre: | Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU) |
| Date Deposited: | 21 Sep 2010 07:03 |
| Last Modified: | 21 Sep 2010 07:03 |
| URI: | http://eprints.iisc.ernet.in/id/eprint/32297 |
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