Ramprasad, BS and Radha, TS (1978) A simple method for the measurement of stress in evaporated thin films by real-time holographic interferometry. In: Thin Solid Films, 51 (3). 335-338 .
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Official URL: http://dx.doi.org/10.1016/0040-6090(78)90296-1
Abstract
The properties of thin films depend to a large extent upon their mechanical stability which in turn is dependent on the intrinsic stresses developed during evaporation. This paper describes a simple method for the measurement of stresses in thin films by the use of real-time holographic interferometry.
| Item Type: | Journal Article |
|---|---|
| Additional Information: | Copyright of this article belong to Elsevier Science. |
| Department/Centre: | Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU) |
| Date Deposited: | 27 Sep 2010 11:39 |
| Last Modified: | 27 Sep 2010 11:39 |
| URI: | http://eprints.iisc.ernet.in/id/eprint/32461 |
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