Ramprasad, BS and Radha, TS (1978) A simple method for the measurement of stress in evaporated thin films by real-time holographic interferometry. In: Thin Solid Films, 51 (3). 335-338 .
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The properties of thin films depend to a large extent upon their mechanical stability which in turn is dependent on the intrinsic stresses developed during evaporation. This paper describes a simple method for the measurement of stresses in thin films by the use of real-time holographic interferometry.
|Item Type:||Journal Article|
|Additional Information:||Copyright of this article belong to Elsevier Science.|
|Department/Centre:||Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU)|
|Date Deposited:||27 Sep 2010 11:39|
|Last Modified:||27 Sep 2010 11:39|
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