Kar, Swastik and Raychaudhuri, AK (2002) Onset of long-range diffusion and exponent of 1/f \alpha noise in metal films with electromigration damage. In: Applied Physics Letters, 81 (27). pp. 5165-5167.
Investigations of low-frequency conductance fluctuations have been done on silver films which have been made to undergo electromigration damage. The system shows a clear increase in noise magnitude after electromigration damage. The noise spectral power shows a distinct presence of $1/f^3^/^2$ component arising out of long-range diffusion. The temperature dependence of noise (150 K<T<350 K) shows a marked deviation from the Dutta-Horn type behavior with the $1/f^3^/^2$ term showing a strong dominance at higher temperatures. We propose that the increase of noise in metal films after electromigration damage arise predominantly from this spectral component.
|Item Type:||Journal Article|
|Additional Information:||Copyright for this article belongs to American Institute of Physics (AIP).|
|Department/Centre:||Division of Physical & Mathematical Sciences > Physics|
|Date Deposited:||08 Jun 2005|
|Last Modified:||19 Sep 2010 04:19|
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