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System effects in double‐channel gated‐integrator‐based deep‐level transient spectroscopy

Balasubramanyam, N and Kumar, Vikram (1988) System effects in double‐channel gated‐integrator‐based deep‐level transient spectroscopy. In: Journal of Applied Physics, 64 (11). 6311 -6314.

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Abstract

The effects of the two sampling gate positions, and their widths and the integrator response times on the position, height, and shape of the peaks obtained in a double‐channel gated‐integrator‐based deep‐level transient spectroscopy (DLTS) system are evaluated. The best compromise between the sensitivity and the resolution of the DLTS system is shown to be obtained when the ratio of the two sampling gate positions is about 20. An integrator response time of about 100 ms is shown to be suitable for practical values of emission time constants and heating rates generally used.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to American Institute of Physics.
Department/Centre: Division of Physical & Mathematical Sciences > Physics
Date Deposited: 11 Oct 2010 08:49
Last Modified: 11 Oct 2010 08:49
URI: http://eprints.iisc.ernet.in/id/eprint/33011

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