Satish, L and Vora, Santosh C (2010) Amplitude Frequency Response Measurement: A Simple Technique. In: IEEE Transactions on Education, 53 (3). pp. 365-371.
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A simple method is described to combine a modern function generator and a digital oscilloscope to configure a setup that can directly measure the amplitude frequency response of a system. This is achieved by synchronously triggering both instruments, with the function generator operated in the ``Linear-Sweep'' frequency mode, while the oscilloscope is operated in the ``Envelope'' acquisition mode. Under these conditions, the acquired envelopes directly correspond to the (input and output signal) spectra, whose ratio yields the amplitude frequency response. The method is easy to configure, automatic, time-efficient, and does not require any external control or interface or programming. This method is ideally suited to impart hands-on experience in sweep frequency response measurements, demonstrate resonance phenomenon in transformer windings, explain the working principle of an impedance analyzer, practically exhibit properties of network functions, and so on. The proposed method is an inexpensive alternative to existing commercial equipment meant for this job and is also an effective teaching aid. Details of its implementation, along with some practical measurements on an actual transformer, are presented.
|Item Type:||Journal Article|
|Additional Information:||Copyright 2010 IEEE. Personal use of this material is permitted.However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.|
|Keywords:||Frequency response amplitude and phase; impedance analyzer; normal and envelope acquisition mode; sweep frequency measurement; transformer diagnostics|
|Department/Centre:||Division of Electrical Sciences > Electrical Engineering|
|Date Deposited:||13 Dec 2010 09:51|
|Last Modified:||13 Dec 2010 09:51|
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