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Probing disorder in cubic pyrochlore Bi-1 Zn-5(1) Nb-0(1) O-5(7) (BZN) thin films

Singh, Jitendra and Krupanidhi, SB (2010) Probing disorder in cubic pyrochlore Bi-1 Zn-5(1) Nb-0(1) O-5(7) (BZN) thin films. In: Solid State Communications, 150 (45-46). pp. 2257-2261.

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Official URL: http://dx.doi.org/10.1016/j.ssc.2010.09.030

Abstract

The dielectric response of pulsed laser ablated Bi-1 Zn-5(1) Nb-0(1) O-5(7) (BZN) thin films are investigated within the temperature range of 300-660 K and frequency range of 100 Hz-100 kHz Thin film exhibited a strong dielectric relaxation behavior A sharp rise in dielectric constant of BZN thin film at high temperatures is related to disorder in canon and anion lattices Observed dielectric relaxation implies a redistribution of charges within the unit cell This phenomenon suggests that the large change in dielectric constant is due to a dynamical rise of dipolar fluctuations in the unit cell XPS spectra of BZN (A(2)B(2)O(6)O') cubic pyrochlore confirm that the relaxation corresponds to the ionic hopping among the A and O' positions of several local potential minima Barrier height for hopping is distributed between 0 and 0 94 eV The O is spectrum confirms presence of two types of oxygen in BZN thin film The disorder in charge neutralized thin film is correlated with XPS spectra (C) 2010 Elsevier Ltd All rights reserved

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Elsevier Science.
Keywords: Dielectric; Cubic pyrochlore; PLD
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Date Deposited: 21 Dec 2010 07:40
Last Modified: 21 Dec 2010 07:40
URI: http://eprints.iisc.ernet.in/id/eprint/34545

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