Shibata, Hiroyuki and Ohta, Hiromichi and Nemoto, Takashi and Nagayama, Shun and Waseda, Yoshio and Fujii, Katsushi and Jacob, Thomas K (2010) Measurement for Thermal Effusivity of AlxGa1-xN Alloys Using Thermoreflectance with Periodic Heating. In: High Temperature Materials and Processes, 29 (5-6, S). pp. 515-522.
thermal.2010.pdf - Accepted Version
AlxGa1-xN alloys with x=0.375, 0.398, 0.401, 0.592 and 0.696 were deposited on sapphire substrate by the hydride-vapor-phase epitaxy (HVPE) method. Thermal effusivity measurements were carried out on AlxGa1-xN alloys using a thermal microscope at room temperature. The lag between sinusoidal heating laser wave and thermoreflectance wave was used to measure the thermal diffusivity. Thermal conductivity values of the AlxGa1-xN alloys were also obtained as a function of AIN mole fraction in the alloy. The thermal conductivity was found to decrease with increasing AIN fraction and the experimental data agree with values estimated using the virtual crystal model.
|Item Type:||Journal Article|
|Additional Information:||Copyright of this article belongs to Freund Publishing House.|
|Keywords:||AlGaN alloys; thermal effusivity; thermal conductivity; thermal microscope|
|Department/Centre:||Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)|
|Date Deposited:||01 Mar 2011 10:56|
|Last Modified:||08 Mar 2011 05:41|
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