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A Sub-Nyquist Sampling Method For Computing The Level-crossing-times Of An Analog Signal: Theory And Applications

Seelamantula, Chandra Sekhar (2010) A Sub-Nyquist Sampling Method For Computing The Level-crossing-times Of An Analog Signal: Theory And Applications. In: International Conference on Signal Processing and Communications, JUL 18-21, 2010, Indian Inst Sci, Bangalore, INDIA.

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Abstract

We address the problem of computing the level-crossings of an analog signal from samples measured on a uniform grid. Such a problem is important, for example, in multilevel analog-to-digital (A/D) converters. The first operation in such sampling modalities is a comparator, which gives rise to a bilevel waveform. Since bilevel signals are not bandlimited, measuring the level-crossing times exactly becomes impractical within the conventional framework of Shannon sampling. In this paper, we propose a novel sub-Nyquist sampling technique for making measurements on a uniform grid and thereby for exactly computing the level-crossing times from those samples. The computational complexity of the technique is low and comprises simple arithmetic operations. We also present a finite-rate-of-innovation sampling perspective of the proposed approach and also show how exponential splines fit in naturally into the proposed sampling framework. We also discuss some concrete practical applications of the sampling technique.

Item Type: Conference Paper
Additional Information: Copyright 2010 IEEE. Personal use of this material is permitted.However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collectiveworks for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Keywords: level-crossing; sub-Nyquist sampling; sparse signals; splines; finite rate of innovation
Department/Centre: Division of Electrical Sciences > Electrical Engineering
Date Deposited: 31 Mar 2011 07:20
Last Modified: 31 Mar 2011 07:20
URI: http://eprints.iisc.ernet.in/id/eprint/36367

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