Pandiaraman, M and Soundararajan, N and Vijayan, C and Kumar, C and Ganesan, R (2010) Spectroscopic Studies on Silver Selenide Thin Films. In: Journal of Ovonic Research, 6 (6). pp. 285-295.
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Silver selenide thin films of thickness between 80 nm and 160 nm were prepared by thermal evaporation technique at a high vacuum better than 2x10(-5)mbar on well cleaned glass substrates at a deposition rate of 0.2 nm/sec. Silver selenide thin films were polycrystalline with orthorhombic structure. Ellipsometric spectra of silver selenide thin films have been recorded in the wavelength range between 300 nm and 700 nm. Optical constants like refractive index, extinction coefficient, absorption coefficient, and optical band gap of silver selenide thin film have been calculated from the recorded spectra. The refractive index of silver selenide has been found to vary between 1.9 and 3.2 and the extinction coefficient varies from 0.5 to 1.6 with respect to their corresponding thickness of the films. Transmittance spectra of these films have been recorded in the wavelength range between 300 nm and 900 nm and its spectral data are analysed. The photoluminescence studies have been carried out on silver selenide thin films and the strong emission peak is found around 1.7 eV. The calculated optical band of thermally evaporated silver selenide thin films is found to be around 1.7 eV from their Ellipsometric, UV-Visible and Photoluminescence spectroscopic studies.
|Item Type:||Journal Article|
|Additional Information:||Copyright of this article belongs to Natl Inst R&D Materials Physics.|
|Keywords:||Optical properties;Thin films;Emission;Band gap|
|Department/Centre:||Division of Physical & Mathematical Sciences > Physics|
|Date Deposited:||15 Apr 2011 05:43|
|Last Modified:||15 Apr 2011 05:43|
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