Srinivas, M and Patnaik, LM (1996) On generating optimal signal probabilities for random tests: A genetic approach. In: VLSI Design, 4 (3). pp. 207-215.
075798.pdf - Published Version
Restricted to Registered users only
Download (1124Kb) | Request a copy
Genetic Algorithms are robust search and optimization techniques. A Genetic Algorithm based approach for determining the optimal input distributions for generating random test vectors is proposed in the paper. A cost function based on the COP testability measure for determining the efficacy of the input distributions is discussed, A brief overview of Genetic Algorithms (GAs) and the specific details of our implementation are described. Experimental results based on ISCAS-85 benchmark circuits are presented. The performance pf our GA-based approach is compared with previous results. While the GA generates more efficient input distributions than the previous methods which are based on gradient descent search, the overheads of the GA in computing the input distributions are larger. To account for the relatively quick convergence of the gradient descent methods, we analyze the landscape of the COP-based cost function. We prove that the cost function is unimodal in the search space. This feature makes the cost function amenable to optimization by gradient-descent techniques as compared to random search methods such as Genetic Algorithms.
|Item Type:||Journal Article|
|Additional Information:||Copyright of this article belongs to Hindawi Publishing Corporation.|
|Keywords:||Testing;Random Test Vectors;Signal Probabilities;Genetic Algorithms;COP testability measure|
|Date Deposited:||07 May 2011 04:42|
|Last Modified:||07 May 2011 04:42|
Actions (login required)