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Study of fast transients generated in a GIS bus duct in compressed $SF_6-N_2$ gas mixtures containing lower percentages of $SF_6$

Singha, S and Joy, Thomas M and Naidu, MS (2000) Study of fast transients generated in a GIS bus duct in compressed $SF_6-N_2$ gas mixtures containing lower percentages of $SF_6$. In: Eighth International Conference on Dielectric Materials, Measurements and Applications, 2000, 17-21 Sept, Edinburgh, pp. 118-112.

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Abstract

This paper deals with the study of Very Fast Transient Overvoltages (VFTO) with $SF_6-N_2$ gas mixture as the insulating medium, but with lower percentages of $SF_6$ in the mixture. The investigations are performed using a laboratory model bus duct. A capacitive voltage sensor was used to measure the peak VFTO and temporal characteristics. Measurements were carried out in $SF_6-N_2$ gas mixtures wherein the concentration of $SF_6$ was varied from 0 to 20% over a pressure range of 1 to 5 bars. The results are then compared with those obtained for pure $SF_6$. The VFTO characteristics obtained for SF6 and $SF_6-N_2$ mixtures show similar trends in variations. The levels of surge peak magnitudes are less than 2.0 p.u. in the experimental pressure range in all the cases. In $N_2$, the VFTO level remains almost constant with increase in pressure whereas in the case of mixtures, the VFTO level was found to increase with increase in pressure as well as with increase in the percentage of $SF_6$ in the mixture. In mixtures, no significant difference in the VFTO levels is seen between 2-4 bars, although this fact is more pronounced at percentages of $SF_6$ higher than 5%. This can be attributed to the occurrence of corona stabilization in the breakdown process.

Item Type: Conference Paper
Additional Information: Copyright for this article belongs to Institution of Electrical Engineers (IEE)
Department/Centre: Division of Electrical Sciences > High Voltage Engineering (merged with EE)
Date Deposited: 10 Oct 2005
Last Modified: 19 Sep 2010 04:20
URI: http://eprints.iisc.ernet.in/id/eprint/3806

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