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Escape of high mass ions due to initial thermal energy and its implications for axially symmetric RF ion trap mass analyzer design

Subramanyan, Ganapathy EK and Mohanty, Atanu K (2011) Escape of high mass ions due to initial thermal energy and its implications for axially symmetric RF ion trap mass analyzer design. In: International Journal of Mass Spectrometry, 303 (1). pp. 31-41.

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Official URL: http://dx.doi.org/10.1016/j.ijms.2010.12.013

Abstract

This paper investigates the loss of high mass ions due to their initial thermal energy in ion trap mass analyzers. It provides an analytical expression for estimating the percentage loss of ions of a given mass at a particular temperature, in a trap operating under a predetermined set of conditions. The expression we developed can be used to study the loss of ions due to its initial thermal energy in traps which have nonlinear fields as well as those which have linear fields. The expression for the percentage of ions lost is shown to be a function of the temperature of the ensemble of ions, ion mass and ion escape velocity. An analytical expression for the escape velocity has also been derived in terms of the trapping field, drive frequency and ion mass. Because the trapping field is determined by trap design parameters and operating conditions, it has been possible to study the influence of these parameters on ion loss. The parameters investigated include ion temperature, magnitude of the initial potential applied to the ring electrode (which determines the low mass cut-off), trap size, dimensions of apertures in the endcap electrodes and RF drive frequency. Our studies demonstrate that ion loss due to initial thermal energy increases with increase in mass and that, in the traps investigated, ion escape occurs in the radial direction. Reduction in the loss of high mass ions is favoured by lower ion temperatures, increasing low mass cut-off, increasing trap size, and higher RF drive frequencies. However, dimensions of the apertures in the endcap electrodes do not influence ion loss in the range of aperture sizes considered. (C) 2010 Elsevier B.V. All rights reserved.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Elsevier Science B.V.
Keywords: Mechanism of ion loss;Sensitivity;Thermal energy;Escape velocity;RF trap design;Nonlinear ion trap mass analyzer
Department/Centre: Division of Information Sciences > Supercomputer Education & Research Centre
Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU)
Division of Physical & Mathematical Sciences > Physics
Date Deposited: 22 Jun 2011 09:24
Last Modified: 22 Jun 2011 09:24
URI: http://eprints.iisc.ernet.in/id/eprint/38419

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