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Radiation induced modifications on microstructure and related properties of high temperature superconductor YBCO

Marhas, MK and Balakrishnan, K and Saravanan, P and Ganesan, V and Srinivasan, R and Kanjilal, D and Mehta, GK and Vedwyas, M and Ogale, SB and Pai, SP and Rao, MSR and Pinto, R and Rao, GM and Senthilnathan, S and Mohan, S (1999) Radiation induced modifications on microstructure and related properties of high temperature superconductor YBCO. In: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with , 156 (1-4). pp. 21-29.

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Official URL: http://dx.doi.org/10.1016/S0168-583X(99)00270-0

Abstract

Role of swift heavy ion irradiation on the modification of transport and structural properties of high temperature superconductors is studied. Good quality YBCO thin films prepared by high pressure oxygen sputtering and laser ablation were used in this investigation. Resistivity and atomic force microscopy (AFM) were mainly used to probe superconducting and microstructural modifications resulted from the irradiation of high energy and heavy ions like 100 MeV oxygen and 200 MeV silver. Radiation induced sputtering or erosion is likely to be a major disastrous component of such high energy irradiation that could be powerful in masking phase coherence effects, atleast in grain boundaries. The extent of damage/nature of defects other than columnar defects produced by swift heavy ions is discussed in the light of AFM measurements. The effect of high energy oxygen ion irradiation is anomalous. A clear annealing effect at higher doses is seen. (C) 1999 Elsevier Science B.V. All rights reserved.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Elsevier Science.
Keywords: High temperature superconductors;Radiation damage;Heavy ion irradiation;Atomic force microscopy
Department/Centre: Division of Physical & Mathematical Sciences > Instrumentation and Applied Physics (Formally ISU)
Date Deposited: 29 Jun 2011 04:22
Last Modified: 29 Jun 2011 04:22
URI: http://eprints.iisc.ernet.in/id/eprint/38740

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