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Structural phase transitions in Bi2V1-xGexO5.5-x/2 (x=0.2, 0.4, and 0.6) single crystals: X-ray crystallographic study

Sooryanarayana, K and Row, Guru TN and Varma, KBR (1999) Structural phase transitions in Bi2V1-xGexO5.5-x/2 (x=0.2, 0.4, and 0.6) single crystals: X-ray crystallographic study. In: Materials Research Bulletin, 34 (3). pp. 425-432.

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Official URL: http://dx.doi.org/10.1016/S0025-5408(99)00026-4

Abstract

Single crystals of Bi2V1-xGexO5.5-x/2 (x = 0.2, 0.4, and 0.6) were grown by slow cooling of melts. Bismuth vanadate transforms from an orthorhombic to a tetragonal structure and subsequently to an orthorhombic system when the Ge4+ concentration was varied from x = 0.2 to x = 0.6. All of these compositions crystallized in polar space groups (Aba2, F4mm, and Fmm2 for x = 0.2, 0.4, and 0.6, respectively). The structures were fully determined by single crystal X-ray diffraction studies, (C) 1999 Elsevier Science Ltd.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Elsevier Science.
Keywords: D.crystal structure;C.X-ray diffraction;D.ferroelectricity;D. phase transitions
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Division of Chemical Sciences > Solid State & Structural Chemistry Unit
Date Deposited: 30 Jun 2011 07:44
Last Modified: 30 Jun 2011 07:44
URI: http://eprints.iisc.ernet.in/id/eprint/38798

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