Karmakar, G and Sen, R and Meikap, AK and Chattopadhyay, SK and Chatterjee, SK and Surappa, MK (1999) The studies on micro-structural defects in deformed composite matrix of Al-Si-Mg and SiC. In: Japanese Journal of Applied Physics, 38 (11). pp. 6450-6453.Full text not available from this repository.
Detailed Fourier line shape analysis has been performed on three different compositions of the composite matrix of Al-Si-Mg and SiC. The alloy composition in wt% is Al-7%Si, 0.35%Mg, 0.14%Fe and traces of copper and titanium (similar to 0.01%) with SiC varying from 0 to 30wt% in three steps i.e., 0, 10 and 30wt%. The line shift analysis has been performed by considering 111, 200, 220, 311 and 222 reflections after estimating their relative shift. Peak asymmetry analysis has been performed considering neighbouring 111 and 200 reflections and Fourier line shape analysis has been performed after considering the multiple orders 111 and 222, 200 and 400 reflections. Combining all these three analyses it has been found that the deformation stacking faults both intrinsic alpha' and extrinsic alpha " are absent in this alloy system whereas the deformation twin beta has been found to be positive and increases with the increase of SiC concentration. So, like other Al-base alloys this ternary alloy also shows high stacking fault energy, and the addition of SiC introduces deformation twin which increases with its concentration in the deformed lattices.
|Item Type:||Journal Article|
|Additional Information:||Copyright of this article belongs to Institute of Pure and Applied Physics.|
|Keywords:||X-ray diffraction;Fourier line shape analysis;microstructural defects;stacking faults;Al base alloys with SiC;composite matrix|
|Department/Centre:||Division of Mechanical Sciences > Materials Engineering (formerly Metallurgy)|
|Date Deposited:||03 Aug 2011 09:43|
|Last Modified:||03 Aug 2011 09:43|
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