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Electron diffraction structure analysis: structural research with low-quality diffraction data

Steurer, Walter (2002) Electron diffraction structure analysis: structural research with low-quality diffraction data. In: Zeitschrift für Kristallographie, 218 (4). pp. 269-278.

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Official URL: http://www.oldenbourg-link.com/doi/abs/10.1524/zkr...

Abstract

Electron Diffraction Structure Analysis (EDSA) with data from standard selected-area electron diffraction (SAED) is still the method of choice for structure determination of nano-sized single crystals. The recently determined heavy atom structure α-Ti2Se (Albe & Weirich, 2003) is used as an example to illustrate the developed procedure for structure determination from two-dimensionally SAED data via direct methods and kinematical least-squares refinement. Despite the investigated crystallite had a relatively large effective thickness of about 230 Å as determined from dynamical calculations, the obtained structural model from SAED data was found in good agreement with the result from an earlier single crystal X-ray study (Weirich, Pöttgen & Simon, 1996). Arguments, which support the validity of the used quasi-kinematical approach, are given in the text. The influences of dynamical and secondary scattering on the quality of the data and the structure solution are discussed. Moreover, the usefulness of first-principles calculations for verifying the results from EDSA is demonstrated by two examples, whereas one of the structures was unattainable by conventional X-ray diffraction.

Item Type: Editorials/Short Communications
Additional Information: Copyright of this article belongs to Electron Crystallography.
Department/Centre: Others
Date Deposited: 21 Jul 2011 09:00
Last Modified: 21 Jul 2011 09:00
URI: http://eprints.iisc.ernet.in/id/eprint/39127

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