Raychaudhuri, AK (2002) Measurement of 1/f noise and its application in materials science. In: Current Opinion in Solid State & Materials Science, 6 (1). pp. 67-85.
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Abstract
This is a review of the measurement of I If noise in certain classes of materials which have a wide range of potential applications. This includes metal films, semi-conductors, metallic oxides and inhomogeneous systems such as composites. The review contains a basic introduction to this field, the theories and models and follows it up with a discussion on measurement methods. There are discussions on specific examples of the application of noise spectroscopy in the field of materials science. (C) 2002 Elsevier Science Ltd. All rights reserved.
| Item Type: | Journal Article |
|---|---|
| Additional Information: | Copyright of this article belongs to Elsevier Science. |
| Department/Centre: | Division of Physical & Mathematical Sciences > Physics |
| Date Deposited: | 20 Jul 2011 05:52 |
| Last Modified: | 20 Jul 2011 05:52 |
| URI: | http://eprints.iisc.ernet.in/id/eprint/39272 |
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