Raychaudhuri, AK (2002) Measurement of 1/f noise and its application in materials science. In: Current Opinion in Solid State & Materials Science, 6 (1). pp. 67-85.
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This is a review of the measurement of I If noise in certain classes of materials which have a wide range of potential applications. This includes metal films, semi-conductors, metallic oxides and inhomogeneous systems such as composites. The review contains a basic introduction to this field, the theories and models and follows it up with a discussion on measurement methods. There are discussions on specific examples of the application of noise spectroscopy in the field of materials science. (C) 2002 Elsevier Science Ltd. All rights reserved.
|Item Type:||Journal Article|
|Additional Information:||Copyright of this article belongs to Elsevier Science.|
|Department/Centre:||Division of Physical & Mathematical Sciences > Physics|
|Date Deposited:||20 Jul 2011 05:52|
|Last Modified:||20 Jul 2011 05:52|
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