Laha, A and Victor, P and Victor, P (2002) Study of relaxor behavior of 0.7Pb(Mg1/3Nb2/3)O-3-0.3PbTiO(3) thin films. In: Integrated Ferroelectrics, 46 (1). pp. 153-162.Full text not available from this repository.
Relaxor properties of polycrystalline 0.7Pb(Mg1/3Nb2/3)O-3-0.3PbTiO(3) (PMN-PT) thin films were studied in terms of the diffuse nature of phase transition along with the frequency dispersion of temperature (T-m) at which the dielectric constant exhibits maximum value. Existence of remnant polarization (P-r) above the phase transition temperature, which is a characteristic property of typical relaxor ferroelectric has also been observed in the present case. The films exhibited a gradual decrease of remnant polarization with increase of temperature. Among the different models of relaxor ferroelectric, Vogel-Fulcher model has been found to be suitable to describe the frequency dispersion of T-m in this case. Freezing of dipole moment with decrease of temperature was thought to be the origin of the temperature dependence of dielectric dispersion.
|Item Type:||Journal Article|
|Additional Information:||Copyright of this article belongs to Taylor and Francis Group.|
|Keywords:||Pmn-PT;Thin Films; Relaxor;Vogel-Fulcher|
|Department/Centre:||Division of Chemical Sciences > Materials Research Centre|
|Date Deposited:||28 Jul 2011 05:31|
|Last Modified:||28 Jul 2011 05:31|
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