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Study of relaxor behavior of 0.7Pb(Mg1/3Nb2/3)O-3-0.3PbTiO(3) thin films

Laha, A and Victor, P and Victor, P (2002) Study of relaxor behavior of 0.7Pb(Mg1/3Nb2/3)O-3-0.3PbTiO(3) thin films. In: Integrated Ferroelectrics, 46 (1). pp. 153-162.

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Official URL: http://www.tandfonline.com/doi/abs/10.1080/7137182...

Abstract

Relaxor properties of polycrystalline 0.7Pb(Mg1/3Nb2/3)O-3-0.3PbTiO(3) (PMN-PT) thin films were studied in terms of the diffuse nature of phase transition along with the frequency dispersion of temperature (T-m) at which the dielectric constant exhibits maximum value. Existence of remnant polarization (P-r) above the phase transition temperature, which is a characteristic property of typical relaxor ferroelectric has also been observed in the present case. The films exhibited a gradual decrease of remnant polarization with increase of temperature. Among the different models of relaxor ferroelectric, Vogel-Fulcher model has been found to be suitable to describe the frequency dispersion of T-m in this case. Freezing of dipole moment with decrease of temperature was thought to be the origin of the temperature dependence of dielectric dispersion.

Item Type: Journal Article
Additional Information: Copyright of this article belongs to Taylor and Francis Group.
Keywords: Pmn-PT;Thin Films; Relaxor;Vogel-Fulcher
Department/Centre: Division of Chemical Sciences > Materials Research Centre
Date Deposited: 28 Jul 2011 05:31
Last Modified: 28 Jul 2011 05:31
URI: http://eprints.iisc.ernet.in/id/eprint/39428

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